English | 简体中文 | 繁體中文 | 한국어 | 日本語
Tuesday, 20 May 2014, 08:20 HKT/SGT
Share:
    

Source: Applied Materials, Inc.
Applied Materials Introduces the Most Advanced Fully Automated Wafer Inspection System for Solar Manufacturing
-- World-class photoluminescence and 100% automated inspection technologies predict final wafer efficiency and improve production yield and savings
-- Integrates most advanced inspection capabilities, providing industry's highest review accuracy of wafer quality

SHANGHAI, May 20, 2014 - (ACN Newswire) - At the SNEC 8th International Photovoltaic Power Generation Conference & Exhibition held this week in Shanghai, Applied Materials, Inc. today announced the Applied Vericell(TM) Solar Wafer Inspection System that introduces new capabilities to reduce factory production costs and improve overall average yield of high efficiency solar cell production. These new capabilities include 100 percent in-line wafer inspection to address the quality limitations of manual review, and to automatically predict wafer cell efficiency through photoluminescence (PL) technology, enabling customers to process only wafers that meet quality and yield specifications for higher profitability.

"The Vericell system enables real time yield optimization," said Jim Mullin, vice president and general manager of Solar Products for Applied Materials' Energy and Environmental Solutions Group. "Our customers can now cost-effectively track incoming and outgoing wafer quality and adjust manufacturing processes to improve yield and binning. As the PV industry keeps pace with the "efficiency clock" and transitions to more advanced cells, controlling manufacturing yield becomes a high value problem. The Vericell system has proven its value in predicting yield and increasing profitability in manufacturing at several customer sites."

Using state-of-the-art PL technology combined with multiple sensing capability and advanced software algorithms, the Vericell system can predict final cell efficiency from bare wafer material with a mean average prediction error of less than 0.15% on multi-crystalline silicon wafers. Removing low-efficiency wafers and identifying those that require process modifications provides overall improvement in a factory's output of higher efficiency cells, which can significantly improve profitability. While PL technology has been used for inspection, the automation capabilities of the Vericell tool enable its predictive accuracy and easy integration into existing production lines for immediate benefits.

The Vericell system's multiple integrated inspection modules automatically evaluate each wafer to find and eliminate defective wafers from production. It measures and reports on a range of parameters including wafer thickness, thickness variations, warp and resistivity. The system also detects defects including saw marks, chipped edges, stains, and micro-cracks. By controlling quality and minimizing the risk and costs of wafer breakage from manual inspection, the Vericell tool can provide customers significant gain in factory production.

The Vericell system is available with Applied's proprietary yield management software that can be utilized to collect, consolidate and analyze real-time data. This software allows customers to quickly identify and act on yield-impacting events to optimize their entire manufacturing line.

Applied Materials, Inc. (Nasdaq:AMAT) is the global leader in providing innovative equipment, services and software to enable the manufacture of advanced semiconductor, flat panel display and solar photovoltaic products. Our technologies help make innovations like smartphones, flat screen TVs and solar panels more affordable and accessible to consumers and businesses around the world. Learn more at www.appliedmaterials.com.

Contact:
Connie Duncan (editorial/media) +1-408-563-6209
Michael Sullivan (financial community) +1-408-986-7977

PHOTO: Applied Materials Vericell(TM) Solar Wafer Inspection System
http://hugin.info/143724/R/1787075/613473.jpg

###

This announcement is distributed by NASDAQ OMX Corporate Solutions on behalf of NASDAQ OMX Corporate Solutions clients.

The issuer of this announcement warrants that they are solely responsible for the content, accuracy and originality of the information contained therein.

Source: Applied Materials via Globenewswire

Topic: New Product
Source: Applied Materials, Inc.


https://www.acnnewswire.com
From the Asia Corporate News Network


Copyright © 2024 ACN Newswire. All rights reserved. A division of Asia Corporate News Network.

 

Applied Materials, Inc. Related News
Oct 5, 2023 10:22 HKT/SGT
Electronics Asia Conference 2023 to Highlight IoT, AI/ML, Automotive, and Wireless Developments Driving Semiconductor Industry Growth in Asia
Mar 10, 2016 13:00 HKT/SGT
Thailand's Semiconductor Sector On Track to Tap US$280B Global Automotive Electronics Industry
Feb 19, 2016 10:00 HKT/SGT
Applied Materials Announces First Quarter 2016 Results
Dec 18, 2015 22:30 HKT/SGT
Applied Materials Appoints Adrianna Ma to Board of Directors
Dec 15, 2015 20:30 HKT/SGT
Applied Materials' Chorng-Ping Chang Named 2016 IEEE Fellow
More news >>
Copyright © 2024 ACN Newswire - Asia Corporate News Network
Home | About us | Services | Partners | Events | Login | Contact us | Cookies Policy | Privacy Policy | Disclaimer | Terms of Use | RSS
US: +1 214 890 4418 | China: +86 181 2376 3721 | Hong Kong: +852 8192 4922 | Singapore: +65 6549 7068 | Tokyo: +81 3 6859 8575